The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Oct. 04, 2019
Applicant:
Taiyo Yuden Co., Ltd., Tokyo, JP;
Inventors:
Yasunori Tanahashi, Tokyo, JP;
Hiroyoshi Kobayashi, Tokyo, JP;
Assignee:
TAIYO YUDEN CO., LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/12 (2020.01); H02M 3/156 (2006.01); H03K 17/06 (2006.01); H03K 17/082 (2006.01); H01F 41/00 (2006.01); G01R 31/72 (2020.01);
U.S. Cl.
CPC ...
G01R 31/12 (2013.01); G01R 31/72 (2020.01); H01F 41/00 (2013.01); H02M 3/156 (2013.01); H03K 17/063 (2013.01); H03K 17/0822 (2013.01);
Abstract
A test device according to an embodiment of the present invention includes: a first measurement terminal connected to one end of a first coil to be tested; a second measurement terminal connected to another end of the first coil; a direct-current power source connected to the first measurement terminal; a first semiconductor switch connected between the second measurement terminal and a ground; and a drive unit for turning on and off the first semiconductor switch.