The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Dec. 11, 2017
Applicant:

Nanyang Technological University, Singapore, SG;

Inventors:

Xiao Hu, Singapore, SG;

Chenzhong Mu, Singapore, SG;

Liying Zhang, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 22/02 (2006.01);
U.S. Cl.
CPC ...
G01N 22/02 (2013.01); G01N 2223/03 (2013.01); G01N 2223/052 (2013.01); G01N 2223/615 (2013.01);
Abstract

A non-destructive testing method of analyzing a sample comprising a composite material is disclosed. The method comprises: emitting an electromagnetic signal onto the sample, the electromagnetic signal having a range of frequencies; detecting a response signal transmitted and/or reflected by the sample in response to the electromagnetic signal; processing the response signal to determine variation with frequency of a dielectric permittivity of the sample over the range of frequencies; and determining an indication of a structural characteristic of the sample from a measure of the variation with frequency of the dielectric permittivity of the sample.


Find Patent Forward Citations

Hu, Xiao. (2022). Non-destructive testing methods and apparatus (U.S. Patent No. 11275036). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11275036

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…