The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Sep. 25, 2020
Applicant:

Milliwave Silicon Solutions, Inc., San Jose, CA (US);

Inventors:

JeanMarc Laurent, San Jose, CA (US);

Chinh Doan, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01); G01R 27/32 (2006.01); G01N 22/00 (2006.01); G01N 21/59 (2006.01); G01N 21/55 (2014.01); G01N 21/3581 (2014.01); G01N 22/04 (2006.01); G01N 22/02 (2006.01); G01N 35/00 (2006.01); G01F 23/284 (2006.01); G01F 1/40 (2006.01); G01F 1/56 (2006.01); G01F 1/74 (2006.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); G01N 21/3581 (2013.01); G01N 21/55 (2013.01); G01N 21/59 (2013.01); G01N 22/02 (2013.01); G01N 22/04 (2013.01); G01F 1/40 (2013.01); G01F 1/56 (2013.01); G01F 1/74 (2013.01); G01F 23/284 (2013.01); G01N 2035/00178 (2013.01); G01N 2201/101 (2013.01);
Abstract

Embodiments herein provide a test apparatus and system for a millimeter wave reflection test to measure propagation of millimeter wave signal through a material at various incident angles. In one example, the test apparatus may include a mechanized arch over a base plate, the mechanized arch including antenna carriers coupled to the mechanized arch and configured to hold respective antennas. A motor assembly moves the antenna carriers along the mechanized arch while maintaining the antenna carriers at symmetrical (equal and opposite) angles with respect to the base plate.


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