The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Jun. 24, 2019
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Yousuke Irie, Nara, JP;

Hirotsugu Inoue, Tokyo, JP;

Ryougo Kawai, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/36 (2006.01); G01N 3/34 (2006.01); G01N 3/32 (2006.01); G01N 3/18 (2006.01);
U.S. Cl.
CPC ...
G01N 3/36 (2013.01); G01N 3/18 (2013.01); G01N 3/32 (2013.01); G01N 3/34 (2013.01); G01N 2203/0073 (2013.01); G01N 2203/0222 (2013.01);
Abstract

A fatigue limit stress specification system includes: a vibration generator that repeatedly applies a load to an object to be measured; a temperature sensor that measures a change in temperature of the object to be measured; and an information processing device that measures a fatigue limit stress of the object to be measured. The information processing device obtains a relation between a temperature amplitude of a fundamental frequency component of vibration for the object to be measured and a temperature amplitude of a second harmonic component of the vibration, performs fitting on the relation by using a first approximate line and a second approximate line, the first approximate line including a quadratic curve, the second approximate line including a quadratic curve, and obtains the fatigue limit stress of the object to be measured based on an intersection of the first approximate line and the second approximate line.


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