The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Mar. 25, 2019
Applicants:

Orihara Industrial Co., Ltd., Toshima-ku, JP;

Agc Inc., Chiyoda-ku, JP;

Inventors:

Shuji Orihara, Toshima-ku, JP;

Yoshio Orihara, Toshima-ku, JP;

Satoshi Ogami, Chiyoda-ku, JP;

Seiji Inaba, Chiyoda-ku, JP;

Assignees:

ORIHARA INDUSTRIAL CO., LTD., Toshima-ku, JP;

AGC Inc., Chiyoda-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); C03C 21/00 (2006.01); G01L 1/00 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01L 1/24 (2013.01); C03C 21/002 (2013.01); G01L 1/00 (2013.01); G01N 21/21 (2013.01);
Abstract

A stress measurement device for strengthened glass includes a polarization phase difference variable member configured to vary a polarization phase difference of a laser light by one wavelength of the laser light or more; an imaging element configured to image a plurality of times at a predetermined time interval a scattered light emitted according to the laser light with the varied polarization phase difference entering the strengthened glass, and obtain a plurality of images; and an arithmetic unit configured to measure a periodic change in luminance of the scattered light using the plurality of images, calculate a change in a phase of the change in luminance, and calculate a stress distribution in a depth direction from a surface of the strengthened glass based on the change in the phase.


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