The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Jul. 03, 2019
Wistron Corporation, New Taipei, TW;
Ting-Yu Lin, New Taipei, TW;
Wistron Corporation, New Taipei, TW;
Abstract
A measuring apparatus and a physical characteristic measuring device are provided. The measuring apparatus includes at least one first physical characteristic measuring device and a data processing device. The first physical characteristic measuring device includes a sensor, a signal processing circuit, and a transmission path. The sensor generates a measurement signal according to the physical characteristics of a location where the first physical characteristic measuring device is located. The signal processing circuit converts the measurement signal into a first processed signal. The transmission path is able to be electrically connected to a second physical characteristic measuring device. The transmission path passes a second processed signal of the second physical characteristic measuring device to the data processing device in response to the first physical characteristic measuring device and the second physical characteristic measuring device being electrically connected to each other.