The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Nov. 13, 2018
Duke University, Durham, NC (US);
Ohio State Innovation Foundation, Columbus, OH (US);
Jungsang Kim, Chapel Hill, NC (US);
Clinton Cahall, Durham, NC (US);
Daniel J. Gauthier, Hilliard, OH (US);
Gregory P. Lafyatis, Grandview, OH (US);
Kathryn L. Nicolich, Columbus, OH (US);
Nurul T. Islam, San Jose, CA (US);
Duke University, Durham, NC (US);
Ohio State Innovation Foundation, Columbus, OH (US);
Abstract
An apparatus, method and system for resolving an n-number of photons from an optical source multiphoton event, the apparatus includes a cryostat includes a single-pixel superconducting nanowire single-photon detector (SNSPD) configured to receive an optical signal and therefrom produce a corresponding electrical signal, and a current bias source configured to supply a bias current to the SNSPD. The apparatus further includes a low-noise amplifier configured to produce a low-noise amplified electrical signal from the electrical signal, a signal processing circuit configured to receive the low-noise amplified electrical signal having a waveform rising edge of an n-number photon event to produce either a time-differentiated electrical signal by processing the waveform rising edge with a differentiating circuit to generate a differentiated peak corresponding to the n-number photon event, or a time-to-amplitude electrical signal by processing the waveform rising edge with a precision timing circuit to generate a rise time measurement corresponding to the n-number photon event. The apparatus further includes an amplitude discriminating device configured to determine an integer n-number photon event based on measuring a value of the n-number photon event.