The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Oct. 16, 2018
Applicant:
Honeywell International Inc., Morris Plains, NJ (US);
Inventor:
Tzu-Yu Wang, Maple Grove, MN (US);
Assignee:
Honeywell International Inc., Charlotte, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01F 25/00 (2022.01); G01N 21/11 (2006.01); G01N 21/45 (2006.01); G01N 21/05 (2006.01);
U.S. Cl.
CPC ...
G01F 25/0084 (2013.01); G01N 21/05 (2013.01); G01N 21/11 (2013.01); G01N 21/45 (2013.01);
Abstract
An analytical system includes a laser disposed to direct light toward a microfluidic feature disposed in a feature layer of a multiple layer test cartridge, a sensor to receive reflections from capping layers disposed about the microfluidic feature in the feature layer, and a controller to determine a depth of the microfluidic feature as a function of the received reflections.
Wang, Tzu-Yu. (2022). Method to calibrate disposable cartridge cuvette thickness in-situ (U.S. Patent No. 11274957). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11274957
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile