The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Apr. 29, 2019
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Stanley Pau, Tucson, AZ (US);
Rongguang Liang, Tucson, AZ (US);
ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA, Tucson, AZ (US);
Abstract
Methods, devices and systems are described that use a combination multiple light sources having different coherence lengths to measure surface characteristics of an object. One example system includes a two laser sources configured to operate at a first and a second center wavelength, a broadband source configured to operate at a range of wavelengths outside of the operating range of the at least two lasers, a phase mask array and a color filter arranged, respectively, to impart different phase delays and provide spectral filtering corresponding to the emitted radiation from the sources. A pixelated sensor device is positioned to simultaneously measure intensity values associated with a plurality of interferograms formed due to interference of light from the light sources after propagation through the phase mask array and the color filter. The measured intensity values enable the determination of surface characteristics of the object.