The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Feb. 10, 2020
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Ji Hoon Jang, Palo Alto, CA (US);
George Quintin Stedman, Mountain View, CA (US);
Morten Fischer Rasmussen, San Francisco, CA (US);
Arif Sanli Ergun, Palo Alto, CA (US);
Butrus T. Khuri-Yakub, Palo Alto, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
Features for high intensity focused ultrasound (HIFU) are described. The application of HIFU for ablating tissue may be monitored in real time by imaging bubbles generated during HIFU. A single transducer array may be used by fast switching between imaging and HIFU. For imaging, the array or portions thereof may be used in receive only mode to locate bubbles generated by the HIFU. The application of HIFU, such as location and/or intensity, may be adjusted based on information from the imaging of the bubbles. Physicians and/or others may use these systems and methods to monitor HIFU procedures in real-time for optimal ablation of target tissue with minimal damage to healthy tissue.