The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Jan. 17, 2020
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Yifan Xing, Bellevue, WA (US);

Yuanjun Xiong, Seattle, WA (US);

Wei Xia, Seattle, WA (US);

Wei Li, Seattle, WA (US);

Shuo Yang, Seattle, WA (US);

Meng Wang, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/275 (2018.01); G06T 7/73 (2017.01); G06N 20/00 (2019.01); G06T 15/50 (2011.01);
U.S. Cl.
CPC ...
H04N 13/275 (2018.05); G06N 20/00 (2019.01); G06T 7/73 (2017.01); G06T 15/506 (2013.01);
Abstract

Techniques for data synthesis for training datasets for machine learning applications are described. A first image of at least an object from a first viewpoint is obtained. The first image having associated first image metadata including a first location of a feature of the object in the first image. A model is generated from the first image, the model including a three-dimensional representation of the object. A second image is generated from the model, the second image including the object from a second viewpoint that is different from the first viewpoint. Second image metadata is generated, the second image metadata including a second location of the feature of the object in the second image, the second location corresponding to the first location adjusted for the difference between the second viewpoint and the first viewpoint.


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