The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Jan. 14, 2020
Applicant:

Analog Devices International Unlimited Company, Limerick, IE;

Inventors:

Nicolas Le Dortz, Cambridge, MA (US);

Jonathan Ephraim David Hurwitz, Edinburgh, GB;

Erik D. Barnes, Cambridge, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/128 (2018.01); H04N 13/254 (2018.01); G01S 7/4863 (2020.01); G01S 17/894 (2020.01); G01S 17/10 (2020.01); G01S 17/32 (2020.01); H04N 5/225 (2006.01); H04N 5/232 (2006.01); G01S 7/4915 (2020.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/128 (2018.05); G01S 7/4863 (2013.01); G01S 7/4915 (2013.01); G01S 17/10 (2013.01); G01S 17/32 (2013.01); G01S 17/894 (2020.01); H04N 5/2256 (2013.01); H04N 5/23245 (2013.01); H04N 13/254 (2018.05); H04N 2013/0081 (2013.01);
Abstract

An image processing system for time-of-flight depth imaging includes a processor for determining depth measurements using different modes of operation. The processor determines depth measurements in a first set of frames using a second set of frames. The first mode is a continuous wave modulation mode without depth linearization and the second mode is a continuous wave modulation mode with depth linearization. The depth estimates collected in the second mode using depth linearization are used to correct the depth estimates collected in the first mode.


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