The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Jun. 17, 2019
Fujifilm Corporation, Tokyo, JP;
Shuji Ono, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
The present invention provides an imaging apparatus that individually obtains high image quality, restored images for a plurality of different directions at a wide angle of view without using a lens, and an imaging module using such an imaging apparatus. In an imaging apparatus according to an aspect of the invention, incident light is divided into a plurality of azimuthal regions by a directional sensor, and images corresponding to the azimuthal regions are restored from a plurality of projection images acquired corresponding to the azimuthal regions. Accordingly, incident light from oblique directions does not become noise to incident light from a front direction, and projection images can be individually acquired for the azimuthal regions throughout a wide range from the front direction to the oblique directions. For this reason, restoration processing according to properties of a pattern mask and the projection images is executed, whereby it is possible to individually obtain high image quality restored image for a plurality of different directions (azimuthal regions) at a wide angle of view without using a lens.