The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Jul. 23, 2019
Vmware, Inc., Palo Alto, CA (US);
Uday Shankar Nagaraj, Sunnyvale, CA (US);
Shyam Sambasivan Ramachandran, Mountain View, CA (US);
Natalia Tupy Jensen, Los Gatos, CA (US);
Mansi Babbar, Fremont, CA (US);
Prerit Rodney, Cupertino, CA (US);
VMWARE, INC., Palo Alto, CA (US);
Abstract
Example methods and computer systems are provided for logical overlay network monitoring. The method may comprise: obtaining egress metric information associated with egress encapsulated packets that are sent by a source virtual tunnel endpoint (VTEP) to a destination VTEP over a logical overlay network; and obtaining ingress metric information associated with ingress encapsulated packets that are received by the destination VTEP from the source VTEP over the logical overlay network. The method may also comprise: performing a comparison to identify a divergence between the egress metric information and the ingress metric information; and based on the divergence, detecting a performance issue affecting logical overlay network connectivity between the source VTEP and the destination VTEP.