The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Aug. 17, 2020
Harmonic, Inc., San Jose, CA (US);
Adi Bonen, Belle Mead, NJ (US);
Harmonic, Inc., San Jose, CA (US);
Abstract
Propagating a leakage test signal at a frequency receivable by traditional leakage test systems while supporting enhanced upstream peak data rates. At an input of an amplifier of a device, a portion of the leakage test signal is tapped to create a tapped signal, which comprises both the leakage test signal and all other downstream signals and channels sent from a head-end to a set of customer premises equipment (CPE) via the device. The tapped signal is introduced to a filter that passes the leakage test signal and attenuates all other radio frequency (RF) signals to create a filtered leakage test signal. The filtered leakage test signal is amplified and coupled to a low-pass side of a high-split diplex filter to propagate onto a transmission medium coupled to the HFC plant receivable by a traditional leakage test system. The device may be a high-split RF amplifier or a high-split node.