The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Jan. 25, 2019
Applicants:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Kioxia Corporation, Minato-ku, JP;

Inventors:

Takayuki Tajima, Sagamihara, JP;

Kazuo Shimokawa, Yokohama, JP;

Assignees:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

KIOXIA CORPORATION, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/522 (2006.01); H01L 25/065 (2006.01); H01L 23/00 (2006.01); H01L 23/31 (2006.01); H01L 21/56 (2006.01); H01L 23/532 (2006.01); H01L 23/528 (2006.01); H05K 1/11 (2006.01); H01L 23/538 (2006.01);
U.S. Cl.
CPC ...
H01L 23/5226 (2013.01); H01L 21/561 (2013.01); H01L 21/566 (2013.01); H01L 23/3128 (2013.01); H01L 23/5228 (2013.01); H01L 23/5283 (2013.01); H01L 23/53228 (2013.01); H01L 23/53257 (2013.01); H01L 24/17 (2013.01); H01L 24/96 (2013.01); H01L 25/0655 (2013.01); H01L 23/5384 (2013.01); H01L 24/04 (2013.01); H01L 2224/0231 (2013.01); H01L 2224/02373 (2013.01); H05K 1/113 (2013.01); H05K 1/116 (2013.01);
Abstract

A semiconductor device includes a redistribution layer, a bump bonded to a first surface of the redistribution layer, and a chip bonded to a second surface of the redistribution layer. The redistribution layer includes an insulating layer, a conductive member connecting the bump to the chip and being provided inside the insulating layer, a bonding electrode connected between the conductive member and the bump, and a conductive layer provided between the insulating layer and the conductive member and between the bonding electrode and the conductive member. A resistivity of the conductive member is lower than a resistivity of the conductive layer.


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