The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Jul. 19, 2018
Applicants:

Tadano Ltd., Kagawa, JP;

The School Corporation Kansai University, Osaka, JP;

Inventors:

Takayuki Kosaka, Kagawa, JP;

Iwao Ishikawa, Kagawa, JP;

Satoshi Kubota, Osaka, JP;

Shigenori Tanaka, Osaka, JP;

Kenji Nakamura, Osaka, JP;

Yuhei Yamamoto, Osaka, JP;

Masaya Nakahara, Osaka, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G01S 17/42 (2006.01); G06T 19/00 (2011.01); B60R 1/00 (2022.01); B66C 13/16 (2006.01); B66C 23/90 (2006.01); B66C 23/42 (2006.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); B60R 1/00 (2013.01); B66C 13/16 (2013.01); B66C 23/905 (2013.01); G01S 17/42 (2013.01); G06T 19/006 (2013.01); B60R 2300/301 (2013.01); B66C 23/42 (2013.01); B66C 2700/0378 (2013.01); G06T 2207/10028 (2013.01);
Abstract

Provided is a method for clustering the data point groups of one or more measurement targets located in the same region from among the acquired data point groups. This method is provided with: acquiring a data point group in a region that contains a measurement target from above the measurement target by using a laser scanner; clustering the data point groups that correspond to the top surface of the measurement target as a planar cluster by using a data processing unit; extracting a reference planar cluster which is a reference for making a same-region determination; calculating the difference in height between the reference planar cluster and other planar clusters, and searching for planar clusters exhibiting a height difference within a prescribed threshold; selecting one planar cluster exhibiting a height difference within the prescribed threshold; detecting whether there is overlap between the reference planar cluster and the one planar cluster; and clustering the planar clusters as clusters in the same region when overlap is detected.


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