The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
May. 14, 2019
Sri International, Menlo Park, CA (US);
Garbis Salgian, Princeton Junction, NJ (US);
Bogdan C. Matei, Princeton Junction, NJ (US);
Taragay Oskiper, Princeton, NJ (US);
Mikhail Sizintsev, Plainsboro, NJ (US);
Rakesh Kumar, West Windsor, NJ (US);
Supun Samarasekera, Skillman, NJ (US);
SRI International, Menlo Park, CA (US);
Abstract
Computer aided inspection systems (CAIS) and method for inspection, error analysis and comparison of structures are presented herein. In some embodiments, a CAIS may include a SLAM system configured to determine real-world global localization information of a user in relation to a structure being inspected using information obtained from a first sensor package, a model alignment system configured to: use the determined global localization information to index into a corresponding location in a 3D computer model of the structure being inspected; and align observations and/or information obtained from the first sensor package to the local area of the model 3D computer model of the structure extracted; a second sensor package configured to obtain fine level measurements of the structure; and a model recognition system configured to compare the fine level measurements and information obtained about the structure from the second sensor package to the 3D computer model.