The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Dec. 27, 2019
Applicant:

Shanghai United Imaging Intelligence Co., Ltd., Shanghai, CN;

Inventors:

Yanbo Chen, Shanghai, CN;

Yaozong Gao, Shanghai, CN;

Yiqiang Zhan, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06K 9/6228 (2013.01); G06K 9/628 (2013.01); G06K 9/6277 (2013.01); G06K 2209/053 (2013.01);
Abstract

The present disclosure provides a system and method for classification determination of a structure. The method may include obtaining image data representing a structure of a subject. The method may also include determining a plurality of candidate classifications of the structure and their respective probabilities by inputting the image data into a classification model. The classification model may include a backbone network for determining a backbone feature of the structure, a segmentation network for determining a segmentation feature of the structure, and a density classification network for determining a density feature of the structure. The method may further include determining a target classification of the structure based on at least a part of the probabilities of the plurality of candidate classifications.


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