The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Mar. 19, 2020
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Wanlong Li, Beijing, CN;

Jianfei Li, Shenzhen, CN;

Yajun Gao, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4609 (2013.01); G06K 9/00664 (2013.01); G06K 9/00744 (2013.01);
Abstract

Systems and methods of visual simultaneous localization and mapping (SLAM) based on point and line features are disclosed. The method includes: receiving a visual image frame input by a camera device; extracting feature points and feature lines from the visual image frame; predicting a first pose of the camera device using the feature points; observing an extracted first feature line to determine a feature line measurement of the first feature line; obtaining a global feature line state vector set of the camera device, where the global feature line state vector set includes feature line state vectors of N historical feature lines, and N is a positive integer; and updating the first pose using the feature line measurement and the global feature line state vector set. In this way, feature point-based motion estimations and observation features of feature lines observed in an environment are integrated to update a pose of the camera device in real time, thereby improving visual SLAM accuracy.


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