The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Jan. 16, 2020
International Business Machines Corporation, Armonk, NY (US);
Neeraj Madan, Little Elm, TX (US);
Gersain Mesa, Poughkeepsie, NY (US);
Kanayo George Okonji, Wappingers Falls, NY (US);
Steven Holbrooks, Pittsboro, NC (US);
Mark C. Booth, Shippensburg, PA (US);
Rogelio Fernando Gutierrez Valdes, Tlaquepaque, MX;
Chanchal Saha, Beacon, NY (US);
Oscar Alejandro de la Torre, Japopan, MX;
Christian Nugraha, Singapore, SG;
Anthony George Gorey, Fishkill, NY (US);
Teik Seng Poh, Singapore, SG;
Richard Laviano, Research Triangle, NC (US);
Robert Edge, Jr., Port Ewen, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A cognitive test advisor facility is provided to identify repair action recommendations. The facility receives a user input regarding a test failure, and generates an expanded search input by identifying additional, alternative words for the user input. A database(s) is searched for test failure records relevant to keywords of the expanded search input, and relevant test failure records are prioritized using a relationship strength score based, at least in part, on relationship of the test failure records to the expanded search input. The facility detects test failure records from the searching having a relationship strength score higher than a threshold value, and analyzes the detected test failure records to identify potential test repair actions. Based on the analyzing, the facility generates a solution priority list including one or more suggested test repair actions for the test failure, and provides the solution priority list to the user.