The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Mar. 08, 2018
Applicant:

Symbol Technologies, Llc, Lincolnshire, IL (US);

Inventors:

Shan Chu, St. James, NY (US);

Chikwan Cheung, Jericho, NY (US);

Zi Peng Xie, Stony Brook, NY (US);

Assignee:

Symbol Technologies, LLC, Holtsville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2635 (2013.01); G06F 11/3037 (2013.01); G06F 11/3409 (2013.01);
Abstract

A method of assessing impact of applications executed by a computing device on a memory of the computing device includes: storing, in the memory, (i) a plurality of reference write operation sizes, and (ii) for each reference write operation size, a corresponding reference endurance indicator defining a write endurance; executing, at a processor of the computing device interconnected with the memory, a monitor application simultaneously with a test application; via execution of the monitor application at the processor: generating a usage profile for the test application, the usage profile defining a measured write operation size and a measured write operation rate for write operations initiated by the test application; determining an impact indicator for the test application based on the usage profile, the reference write operation sizes and the reference endurance indicators; and presenting the impact indicator.


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