The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Jul. 14, 2020
Juniper Networks, Inc., Sunnyvale, CA (US);
Juniper Networks, Inc., Sunnyvale, CA (US);
Abstract
Failure impact analysis (or 'impact analysis') is a process that involves identifying effects of a network event that are may or will results from the network event. In one example, this disclosure describes a method that includes generating, by a control system managing a resource group, a resource graph that models resource and event dependencies between a plurality of resources within the resource group; detecting, by the control system, a first event affecting a first resource of the plurality of resources, wherein the first event is a network event; and identifying, by the control system and based on the dependencies modeled by the resource graph, a second resource that is expected to be affected by the first event.