The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
May. 26, 2020
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventor:
Kazuhiro Satou, Yamanashi, JP;
Assignee:
FANUC CORPORATION, Yamanashi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0736 (2013.01); G06F 11/0766 (2013.01); G06N 3/08 (2013.01);
Abstract
A diagnostic apparatus acquires data relating to a state of a machine, performs preprocessing on the acquired data, and modifies the preprocessed data by using a statistic relating to the state of the machine. Then, the diagnostic apparatus performs a process of machine learning by an auto encoder on the basis of the modified data and learns or diagnoses the state of the machine. Thus, this diagnostic apparatus provides a learning and inference method capable of uniformly handling a scale of data indicating a feature.