The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Feb. 17, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Judd E. Reed, Santa Rosa, CA (US);

Ari Y. Benbasat, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0418 (2013.01); G06F 3/044 (2013.01); G06F 2203/04104 (2013.01);
Abstract

Structured noise from various aggressors can be suppressed to improve touch performance. A respective noise characteristic can be determined for each respective group of touch nodes (e.g., row, column) among multiple groups of touch nodes in a masked touch image. The respective noise characteristic can be removed from the corresponding respective group of touch nodes in the touch image. For example, a respective noise characteristic can be determined for each respective row and/or for each respective column in the masked touch image. The respective noise characteristic can be removed from the respective row and/or column in the unmasked touch image. In some examples, the determining and subtracting of the noise characteristic can be repeated iteratively within a window of time and/or until one or more noise criteria are met.


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