The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Nov. 01, 2019
Applicant:

Uatc, Llc, San Francisco, CA (US);

Inventors:

Sunil Kumar Garg, San Francisco, CA (US);

Todd William Sifleet, Walnut Creek, CA (US);

Venkata Sathya Praveen Gorthy, Pleasanton, CA (US);

Lili Kan, Cupertino, CA (US);

Emily Anna Weslosky, San Francisco, CA (US);

Assignee:

UATC, LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D 1/02 (2020.01); B60K 35/00 (2006.01);
U.S. Cl.
CPC ...
G05D 1/0212 (2013.01); B60K 35/00 (2013.01);
Abstract

Systems and methods for controlling autonomous vehicle test trips are provided. In one example embodiment, a computer implemented method includes obtaining, by a computing system, data indicative of a test trip index associated with an autonomous vehicle. The test trip index includes a plurality of test trips for the autonomous vehicle and each test trip is associated with one or more test trip parameters. The method includes obtaining, by the computing system, data indicating that the autonomous vehicle is available to travel in accordance with at least one of the test trips of the test trip index. The method includes selecting, by the computing system and from the test trip index, at least one selected test trip for the autonomous vehicle. The method includes causing, by the computing system, the autonomous vehicle to travel in accordance with the test trip parameters associated with the at least one selected test trip.


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