The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Mar. 04, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Kyoung-whan Oh, Hwaseong-si, KR;

Ho-youl Lee, Yongin-si, KR;

Won-ki Park, Seoul, KR;

Jong-hwi Seo, Suwon-si, KR;

Young-il Jang, Yongin-si, KR;

Ha-nock Kwak, Seongnam-si, KR;

Byoung-tak Zhang, Seoul, KR;

Seong-ho Choi, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06F 17/14 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G05B 23/024 (2013.01); G06F 17/142 (2013.01); G06N 3/0418 (2013.01);
Abstract

An equipment diagnosis system and method, which use abnormal data and normal data of equipment and accurately and effectively perform diagnosis on the equipment, are provided. The equipment diagnosis system includes a data acquisition unit to acquire time series data of equipment, a preprocessing unit convert the time series data into frequency data including a temporal component through a Fourier transform, a deep learning unit to perform deep learning through a convolution neural network (CNN) by using the frequency data, and a diagnosis unit to determine a state of the equipment to be a normal state or a breakdown state based on the deep learning.


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