The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Feb. 11, 2019
Applicant:
University of Connecticut, Farmington, CT (US);
Inventors:
Bahram Javidi, Storrs, CT (US);
Adam Markman, Orange, CT (US);
Siddharth Rawat, Storrs, CT (US);
Arun Anand, Gujarat, IN;
Assignee:
University of Connecticut, Farmington, CT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H 1/02 (2006.01); G03H 1/04 (2006.01); G01N 21/45 (2006.01); G03H 1/00 (2006.01);
U.S. Cl.
CPC ...
G03H 1/02 (2013.01); G01N 21/453 (2013.01); G03H 1/0443 (2013.01); G03H 1/0005 (2013.01); G03H 2001/005 (2013.01); G03H 2001/0033 (2013.01); G03H 2226/02 (2013.01);
Abstract
Portable common path shearing interferometry-based holographic microscopy systems. The system includes a light source, a sample holder, a microscope objective lens, a shear plate and an imaging device positioned in a common path shearing interferometry configuration. A housing is configured to receive and hold the shear plate and maintain a position of the shear plate relative to the microscope objective lens.