The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
May. 19, 2017
Applicant:
Huron Technologies International Inc., St. Jacobs, CA;
Inventor:
Arthur Edward Dixon, Waterloo, CA;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/16 (2006.01); G02B 21/00 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01); G02B 5/20 (2006.01);
U.S. Cl.
CPC ...
G02B 21/16 (2013.01); G02B 5/201 (2013.01); G02B 21/002 (2013.01); G02B 21/0036 (2013.01); G02B 21/26 (2013.01); G02B 21/365 (2013.01);
Abstract
A scanning microscope and method of operation has a scan filter with a repeat pattern of a plurality of rows that is repeated at least across an active area of an entire surface of an area detector. Each row is covered by a bandpass filter or an emission filter for a specific fluorophore or filters of a particular colour for each row. The scanning microscope can be used to obtain one or more of hyperspectral images, multispectral images, RGB images, RGBW images, W images and Single Field Of View images of a specimen using Moving Specimen Image Averaging. A method of obtaining one or more of the images is also described.