The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Dec. 21, 2017
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventors:

Youli Mao, Houston, TX (US);

Raja Vikram Pandya, Katy, TX (US);

Bhaskar Mandapaka, Tomball, TX (US);

Keshava Prasad Rangarajan, Sugar Land, TX (US);

Srinath Madasu, Houston, TX (US);

Satyam Priyadarshy, Katy, TX (US);

Ashwani Dev, Katy, TX (US);

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/50 (2006.01); G06K 9/62 (2006.01); G06N 7/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G01V 1/301 (2013.01); G01V 1/50 (2013.01); G06K 9/6228 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01); G01V 2210/642 (2013.01);
Abstract

A method includes receiving a training selection of a first set of faults located in a first subset of a seismic dataset for a subsurface geologic formation, detecting a second set of faults in the seismic dataset based on fault interpretation operations using a first set of interpretation parameters, and determining a difference between the first set of faults and the second set of faults. The method also includes generating a second set of interpretation parameters for the fault interpretation operations based on the difference between the first set of faults and the second set of faults, and determining a feature of the subsurface geologic formation based on fault interpretation operations using the second set of interpretation parameters.


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