The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
May. 31, 2017
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Seiji Takemoto, Kobe, JP;
Takeshi Komoto, Kobe, JP;
Hideki Hirayama, Kobe, JP;
Takashi Yoshida, Kobe, JP;
James Ausdenmoore, Elgin, IL (US);
Assignee:
SYSMEX Corporation, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); B01L 3/00 (2006.01); G01N 33/72 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00623 (2013.01); G01N 35/00722 (2013.01); G01N 2035/00653 (2013.01); G01N 2035/00891 (2013.01);
Abstract
The specimen analyzer includes: an input unit which receives an input of subject attribute information; an analysis unit which performs measurement of a specimen collected from a subject, and which performs analysis of the specimen based on a measurement result and the subject attribute information received by the input unit; and a controller which causes the analysis unit to be incapable of analyzing the specimen unless the input of the subject attribute information is performed with the input unit.