The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Jul. 22, 2019
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Satoshi Sano, Kyoto, JP;
Koichi Tanabe, Kyoto, JP;
Yukihisa Wada, Kyoto, JP;
Satoshi Tokuda, Kyoto, JP;
Akira Horiba, Kyoto, JP;
Naoki Morimoto, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); A61B 6/02 (2006.01); G01N 23/046 (2018.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); A61B 6/025 (2013.01); G01N 23/046 (2013.01); A61B 6/484 (2013.01); G01N 2223/401 (2013.01);
Abstract
This X-ray phase imaging system () includes an X-ray source (), a detector (), a first grating group (), a second grating group (), a moving mechanism (), and an image processing unit (). The moving mechanism is configured to relatively move a subject (T) and the imaging system () such that the subject (T) passes through a first grating region (R) and a second grating region (R). The image processing unit is configured to generate a first phase-contrast image () and a second phase-contrast image ().