The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Sep. 18, 2019
Republic of Korea(national Forensic Service Director Ministry of Public Administration and Security), Wonju-si, KR;
Nam Kyu Park, Bucheon-si, KR;
Jae Mo Goh, Wonju-si, KR;
Jin Pyo Kim, Daejeon, KR;
Young Il Seo, Wonju-si, KR;
Eun Ah Joo, Yongin-si, KR;
Je Hyun Lee, Wonju-si, KR;
Sang Yoon Lee, Wonju-si, KR;
Dong A Lim, Daejeon, KR;
Kyung Mi Kim, Namyangju-si, KR;
Abstract
A temperature and humidity chamber type apparatus for taking potential impact marks according to an embodiment includes: a specimen treated with an amino acid reaction reagent to react with potential impact marks to take the potential impact marks; a chamber in which a receiving space for receiving the specimen is secured; a door for opening and closing the chamber; a supporter formed in the receiving space to receive the specimen; an adjuster for adjusting temperature and humidity in the chamber within a set application time range to take the potential impact marks; a display unit attached to one side of the outside of the chamber to display an operation state in the chamber; a power source; a controller for controlling setting of temperature, humidity, and an application time in the chamber; and an input unit in which the controller operates according to a user's input.