The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Oct. 02, 2020
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventors:

Mariko Ito, Niwa-Gun, JP;

Takumi Hongo, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01);
Abstract

An abnormality diagnostic method for a feed axis device that diagnoses an abnormality of the feed axis device including a screw shaft and a nut, the feed axis device being incorporated in mechanical equipment, the abnormality diagnostic method includes controlling an operation of the feed axis device such that the screw shaft operates in a predetermined operating pattern, detecting a physical quantity signal generated from the feed axis device, and performing an abnormality diagnosis for the feed axis device based on the physical quantity signal detected by the detecting in accordance with a predetermined abnormality diagnosis algorithm. The performing includes performing a frequency analysis on the physical quantity signal to extract respective frequencies corresponding to a plurality of operating positions in the operating pattern and performing the abnormality diagnosis based on change of the frequencies corresponding to the respective operating positions.


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