The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
May. 04, 2018
Applicant:
United Technologies Corporation, Farmington, CT (US);
Inventors:
Alan Matthew Finn, Hebron, CT (US);
Ziyou Xiong, Wethersfield, CT (US);
Richard W. Osborne, III, Stafford Springs, CT (US);
Ozgur Erdinc, Mansfield, CT (US);
Assignee:
Raytheon Technologies Corporation, Farmington, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 15/14 (2006.01); G06T 7/00 (2017.01); F01D 5/14 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01M 15/14 (2013.01); F01D 5/141 (2013.01); G01N 21/9515 (2013.01); G06T 7/001 (2013.01); G06T 7/0008 (2013.01); F05D 2220/32 (2013.01); F05D 2220/36 (2013.01); F05D 2230/72 (2013.01); F05D 2270/8041 (2013.01); G06T 2207/30164 (2013.01);
Abstract
A system for component inspection comprising at least one sensor configured to capture sensor data of the component; and a processor coupled to the at least one sensor, the processor comprising at least one model configured to separate the sensor data into a normal category and an abnormal category.