The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Jul. 24, 2020
Applicant:
Raytheon Company, Waltham, MA (US);
Inventor:
Lacy G. Cook, El Segundo, CA (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/54 (2006.01); G01J 5/0806 (2022.01); G01J 5/08 (2022.01); G01S 19/23 (2010.01); G01J 5/00 (2022.01); G01J 5/52 (2022.01);
U.S. Cl.
CPC ...
G01J 5/0806 (2013.01); G01J 5/084 (2013.01); G01S 19/235 (2013.01); G01J 2005/0048 (2013.01); G01J 2005/0077 (2013.01); G01J 2005/528 (2013.01);
Abstract
Methods and apparatus for sensor calibration of a system having an aperture, primary mirror, secondary mirror, and a sensor, such as an FPA IR sensor. A calibration system includes calibration energy sources with a movable first mirror configured to be selectively inserted into the optical path and select one of the calibration energy sources and a second mirror configured to image the selected calibration energy source.