The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

May. 25, 2018
Applicant:

Toyo Corporation, Tokyo, JP;

Inventors:

Tetsuya Nakamura, Tokyo, JP;

Naoki Tsuboi, Tokyo, JP;

Assignee:

TOYO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2889 (2013.01); G01J 2003/283 (2013.01);
Abstract

Provided is a spectrum analysis method including: accumulating n spectrums obtained by consecutively fast Fourier transforming an input signal n times; receiving a threshold; identifying, in the n spectrums accumulated in the accumulating, frequently occurring data that includes data whose number of occurrences exceeds the threshold received in the receiving, the number of occurrences being defined as a total number of items of data at a same frequency point that indicate levels that are close to each other, to within a predetermined range; selecting a maximum level at each of the frequency points from among only the identified frequently occurring data; and outputting a spectrum indicating the maximum levels selected at the frequency points.


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