The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Mar. 27, 2019
Applicant:

Selux Diagnostics, Inc., Charlestown, MA (US);

Inventors:

Eric Stern, Charlestown, MA (US);

Kelly Flentie, Charlestown, MA (US);

Aleksandar Vacic, Charlestown, MA (US);

Frederick P. Floyd, Jr., Charlestown, MA (US);

Assignee:

SELUX DIAGNOSTICS, INC., Charlestown, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/18 (2006.01); B01L 3/02 (2006.01); B01L 3/00 (2006.01); G01N 33/569 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/18 (2013.01); B01L 3/0237 (2013.01); B01L 3/5085 (2013.01); G01N 33/56916 (2013.01); G01N 35/00732 (2013.01); B01L 2200/16 (2013.01); B01L 2300/0893 (2013.01); G01N 2035/0091 (2013.01);
Abstract

An improved system, method and interface for automated rapid antimicrobial susceptibility testing (AST) is disclosed which includes, in one aspect, a carrier population station comprising a workstation having a graphic user interface (GUI). The GUI accepts information from a lab technologist, including information related to a scope of testing to be performed on a microorganism containing sample. The GUI controls intelligent assignment of microorganism containing samples to test panels in a manner that maximize utilization of the test carrier by grouping together samples of similar tests scopes and advantageously testing those samples using one multiplexed test panel. Customizing workflow in accordance with test scope to facilitate parallel processing of multiple samples advantageously reduces laboratory waste, decreases test latencies, increases AST system throughput and efficiency, and thus lowers the costs to the AST lab.


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