The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2022
Filed:
Sep. 06, 2019
Heidelberger Druckmaschinen Ag, Heidelberg, DE;
Jan Krieger, Heidelberg, DE;
Immanuel Fergen, Karlsruhe, DE;
Christoph Godau, Mannheim, DE;
Timo Volk, Mannheim, DE;
Manfred Schneider, Bad Rappenau, DE;
Heidelberger Druckmashinen AG, Heidelberg, DE;
Abstract
A method for automated alignment and register measurement in a printing press provides for test patterns having multiple color separations to be printed by the printing press on a printing substrate, recorded by using at least one image sensor of an image acquisition system as a digital overall image, evaluated by a computer with respect to an alignment/register offset and then corrected by the computer for the alignment/register offset. Circular measuring marks having known diameter for each color separation are integrated into the test patterns and the computer ascertains the center position of each circular measuring mark with subpixel accuracy and thus computes the alignment/register offset by cutting out an image region having at least one circular measuring mark from the digital overall image and determining parameters of a model of a printing point of the circular measuring mark from the digital overall image.