The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Dec. 29, 2017
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Xiaojun Chen, Hangzhou, CN;

Zhenting Li, Hangzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 74/08 (2009.01); H04B 17/318 (2015.01);
U.S. Cl.
CPC ...
H04W 74/0833 (2013.01); H04B 17/318 (2015.01);
Abstract

Embodiments of the present disclosure relate to a method and device for NPRACH detect. In example embodiments, the method comprises determining whether an overlapping ratio between a first period and a second period exceeds a first threshold. A first NPRACH resource is available during the first period and a second NPRACH resource is available during the second period. The first NPRACH resource is associated with a first coverage level and the second NPRACH resource is associated with a second coverage level. The second coverage level is different from the first coverage level. The method also comprises in response to determining that the overlapping ratio exceeds the first threshold, determining a power estimation of noise based on a first plurality of signals received on the first PRACH resource and a second plurality of signals received on the second NPRACH resource. The method also comprises detecting existence of at least one random access preamble on the first NPRACH resource based on the power estimation of noise.


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