The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Jan. 06, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yuki Omagari, Tokyo, JP;

Hiroyuki Sakai, Kanagawa, JP;

Yuki Ishida, Kanagawa, JP;

Tomohiro Suzuki, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/387 (2006.01); H04N 1/32 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/3878 (2013.01); H04N 1/00718 (2013.01); H04N 1/00721 (2013.01); H04N 1/00779 (2013.01); H04N 1/32144 (2013.01);
Abstract

The present disclosure provides a technique to obtain a tilt state occurring between an image capturing unit and a print image having additional information embedded in it without using the visible image. In the technique, an image of a print image in which additional information having a specified frequency characteristic is embedded is captured using an image capturing unit to obtain captured image data. A frequency analysis is performed on partial image data corresponding to a specified area in the obtained captured image data, to obtain distance information on a distance between the specified area and the image capturing unit. Inclination information indicating a state of a relative inclination between the image capturing unit and the print image is obtained based on this distance.


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