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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11265232 B1

PDFFull Text
Date of Patent:
Mar. 01, 2022

Filed:

May. 01, 2020

Iot stream data quality measurement indicator and profiling method and system therefor

Applicant:

Gtone Co., Ltd., Seoul, KR;

Inventors:

Dongwoo Lee, Gyeonggi-do, KR;

Sangyub Lee, Seoul, KR;

Assignee:

GTONE CO., LTD, Seoul, KR;

Attorney:

McCormick, Paulding & Huber PLLC

Primary Examiner:

Jason D Recek

Int. Cl.
CPC ...
H04L 12/26 (2006.01); G16Y 40/10 (2020.01); H04L 43/04 (2022.01); H04L 67/12 (2022.01); G06N 20/00 (2019.01); H04L 43/065 (2022.01);
U.S. Cl.
CPC ...
H04L 43/04 (2013.01); H04L 67/12 (2013.01); G06N 20/00 (2019.01); G16Y 40/10 (2020.01); H04L 43/065 (2013.01);
Abstract

An internet of things (IoT) stream data quality indicator and profiling method and a system therefor are provided. The method for measuring IoT stream data quality includes receiving stream data generated from at least one or more IoT equipment sensors, calculating quality indicators being preset for the received stream data, and measuring quality for the stream data of the IoT equipment sensor based on the calculated quality indicators. The quality indicators include a single signal quality indicator (SSQI) which is a quality indicator for single stream data and a multiple signals quality indicator (MSQI) which is a quality indicator for a relationship between several stream datasets.

Find Patent Forward Citations

Lee, Dongwoo. (2022). Iot stream data quality measurement indicator and profiling method and system therefor (U.S. Patent No. 11265232). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11265232

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