The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Apr. 10, 2019
Nr Electric Co., Ltd, Nanjing, CN;
Nr Engineering Co., Ltd, Nanjing, CN;
Honglin Wang, Nanjing, CN;
Kai Wang, Nanjing, CN;
Qixue Zhang, Nanjing, CN;
Guang Wang, Nanjing, CN;
Jun Chen, Nanjing, CN;
NR ELECTRIC CO., LTD, Nanjing, CN;
NR ENGINEERING CO., LTD, Nanjing, CN;
Abstract
The present invention discloses a method for quickly eliminating ferromagnetic resonance of a voltage transformer. The method includes: first sampling a three-phase voltage and an open-delta voltage of a voltage transformer; calculating a flux linkage corresponding to a zero-sequence voltage by means of an integral algorithm; and when detecting that ferromagnetic resonance occurs in the mutual inductor, further checking whether the absolute value of the flux linkage corresponding to the zero-sequence voltage or the absolute value of the open-delta voltage respectively falls within a set range, and if yes, starting a secondary resonance elimination loop for resonance elimination. The present invention also discloses a corresponding device for quickly eliminating ferromagnetic resonance of a voltage transformer. The present method and device accurately analyze and control resonance elimination trigger time based on a conventional secondary resonance elimination principle, and can effectively eliminate the impact of the core saturation of a voltage transformer on a resonance elimination process, thereby greatly improving the success probability of single resonance elimination.