The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Mar. 31, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yasuhiro Sogawa, Tokyo, JP;

Nobuhiro Mikami, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06F 30/20 (2020.01); E01D 22/00 (2006.01); G06N 7/00 (2006.01); G06Q 10/00 (2012.01); G06Q 50/08 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06375 (2013.01); E01D 22/00 (2013.01); G06F 30/20 (2020.01); G06N 7/005 (2013.01); G06Q 10/20 (2013.01); G06Q 50/08 (2013.01);
Abstract

In order to supplement results of diagnosis of degradation of an object that has been implemented at set intervals using a degradation progression model for simulating the progression of degradation of the object, a degradation prediction apparatusis provided with: a data generation unitconfigured to generate, as supplement data, diagnosis results that would be obtained if the degradation diagnosis were performed at an interval shorter than the set interval; a prediction model generation unitconfigured, using the supplement data, to generate a prediction model for predicting a degradation index indicating a degradation state of the object at a specific point in time; and a degradation index prediction unitconfigured to predict the degradation index of the object based on the prediction model.


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