The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Jan. 28, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yusuke Takeuchi, Boston, MA (US);

Benedikt Graf, Charlestown, MA (US);

Yiting Xie, Cambridge, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01); A61B 8/08 (2006.01); A61B 5/055 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6255 (2013.01); G06K 9/00362 (2013.01); G06K 9/4647 (2013.01); G06K 9/6286 (2013.01); A61B 5/055 (2013.01); A61B 6/5223 (2013.01); A61B 8/523 (2013.01); G06K 2209/05 (2013.01);
Abstract

Mechanisms are provided for determining a measure of radiodensity of anatomical structures of interest and classifying medical imaging study data structures (studies) with regard to contrast phase. In some embodiments, this classification may be used to select/exclude slices for processing by other downstream computing systems. A subset of slices are selected from the study and, for each slice in the subset, a corresponding body part regression (BPR) score is determined. A linear regression on the BPR scores is performed and a representative slice is selected based on results of the linear regression. The representative slice is segmented and a statistical measure of a radiodensity metric for each segment in the representative slice is determined.


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