The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Mar. 08, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Seiji Okura, Meguro, JP;

Masao Ideuchi, Hachioji, JP;

Masahiro Kataoka, Kamakura, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/30 (2020.01); G06F 40/58 (2020.01); G06F 40/45 (2020.01); G06F 40/211 (2020.01); G06F 40/268 (2020.01); G06F 40/284 (2020.01);
U.S. Cl.
CPC ...
G06F 40/45 (2020.01); G06F 40/211 (2020.01); G06F 40/268 (2020.01); G06F 40/284 (2020.01); G06F 40/58 (2020.01);
Abstract

A computer generates a plurality of encoded sentences in the first language by encoding a plurality of sentences in the first language in prescribed units. Next, the computer generates a plurality of encoded sentences in the second language by encoding a plurality of sentences in the second language, each of which is associated with each of the plurality of sentences in the first language, in the prescribed units. The computer generates alignment information based on a code included in each of the plurality of encoded sentences in the first language and a code included in an encoded sentence in the second language, which is associated with each of the plurality of encoded sentences in the first language. The alignment information indicates an alignment between a plurality of codes in the first language and a plurality of codes in the second language.


Find Patent Forward Citations

Okura, Seiji. (2022). Alignment generation device and alignment generation method (U.S. Patent No. 11263408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11263408

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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