The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

May. 30, 2019
Applicant:

Entit Software Llc, Sanford, NC (US);

Inventors:

Manish Marwah, Palo Alto, CA (US);

Andrey Simanovsky, Sunnyvale, CA (US);

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06K 9/62 (2022.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3096 (2013.01); G06F 11/3452 (2013.01); G06K 9/6262 (2013.01);
Abstract

In some examples, a system is to, given an anomaly score threshold over which at least one anomalous point is to be observed in a test set of points with a specified probability, determine, using raw anomaly scores for a training set of points, a first mapping between raw anomaly scores in a first range and first transformed anomaly scores using a first transformation technique. The system is to determine, using the raw anomaly scores for the training set of points, a second mapping between raw anomaly scores in a second range greater than the first range and second transformed anomaly scores using a second transformation technique different from the first transformation technique. The system is to use the first mapping and the second mapping to detect an anomaly in a computing environment based on the test set of points.


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