The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Mar. 19, 2019
Applicant:

Tsinghua University, Beijing, CN;

Inventors:

Qionghai Dai, Beijing, CN;

You Zhou, Beijing, CN;

Jiamin Wu, Beijing, CN;

Guoxun Zhang, Beijing, CN;

Assignee:

TSINGHUA UNIVERSITY, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/08 (2006.01); G02B 21/36 (2006.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
G02B 21/08 (2013.01); G02B 21/361 (2013.01); G02B 21/365 (2013.01); G02B 5/3025 (2013.01);
Abstract

A microscopic imaging system and a microscopic imaging method. The system includes: an illumination module configured to generate a laser illumination, an LCOS device located in a Fourier plane of the laser illumination and configured to modulate a phase of the laser illumination, a 4-F system configured to adjust a size of a light beam of the laser illumination, an excitation lens group configured to generate a point illumination focused in a sample plane, a detecting lens group configured to capture an image of a PSF of the point illumination, a camera sensor, and a controller configured to synchronously control a change in a phase pattern of the LCOS device and an image capture of the camera sensor.


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