The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Sep. 25, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Holger Birk, Meckesheim, DE;
Bernd Widzgowski, Dossenheim, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A method for evaluating a single-photon detector signal includes duplicating the single-photon detector signal into a first and a second signal. The first signal is processed and the second signal is either not processed or is processed in a manner different from the first signal. A differential signal is formed between the unprocessed or differently processed second signal and the processed first signal. The differential signal is evaluated to determine pulse events.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile