The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Sep. 03, 2020
Hangzhou Vango Technologies, Inc., Zhejiang, CN;
Zhengxun Wu, Zhejiang, CN;
Ching-Kae Tzou, Zhejiang, CN;
HANGZHOU VANGO TECHNOLOGIES, INC., Zhejiang, CN;
Abstract
Provided are a method, an apparatus and a device for detecting abnormity of an energy metering chip. The method includes: inputting a target self-test signal to a to-be-tested component of a target energy metering chip in response to the target energy metering chip beginning to run under driving of a power signal; acquiring a first output signal from an output terminal of the to-be-tested component, and inputting the first output signal to a notch filter; inputting a second output signal from an output terminal of the notch filter to a signal correlator, and acquiring a third output signal from an output terminal of the signal correlator; and detecting a running state of the to-be-tested component based on the third output signal, to determine whether the target energy metering chip is abnormal.